Introduction to Crystallography Tutorials B 1200-1WSKRBC6
Classes are focused on solution of practical problems related to subsequent Crystallography B lectures, in particular: stereographic and cyclographic projections, symmetry and symmetry elements, point groups, Laue groups, translational symmetry, space groups, crystal systems, interpretation of space groups in the International Tables for Crystallography, Miller indices, Bravais networks, close and the closest packing of spheres, antisymmetry, reciprocal lattice, symmetry of reciprocal lattices, generation and properties of X-rays, theories of X-ray diffraction and general procedure of structural X-ray analysis.
Type of course
optional courses
Prerequisites (description)
Learning outcomes
We are expecting a fluent solving of problems related to projections, symmetry, point groups and space groups, ability of solving problems related to the solid state. We are also expecting of knowledge on the most important problems related to the X-ray structural analysis of crystals and solution of simple problems focused on these topics.
Assessment criteria
The final mark is the same as for classes and lecture and it is established using the following procedure.
Most of classes shall begin with a short test (ca. 10 min). The results of such tests are rated from 0 to 10 points. The sum of all results is rescaled from 0 to 100 points. There are two written semi-exams during this course: one ca. at the middle of the course and the second one after the end of the course. At each of them each student can gain up to 100 points. So overall the maximum score is 300 points. After these short written tests and semi exams each student has his/her individual score which can be expressed as a percentage of the maximal number of all possible points points which can be scored. Individual final mark of a student is
related to the point score in the following way:
x>90% max. number of points (mnp) mark 5+
80% < x < 90% mnp mark 5
70% < x < 80% mnp mark 4+
60% < x < 70% mnp mark 4
50% < x < 60% mnp mark 3+
40% < x < 50% mnp mark 3
x < 40% mnp mark 2
In the case a student is convinced that deserves a better final mark than the one resulting from the above considerations it is possible to pass an oral examination. The details of such an exam should be fixed individually with the lecturer.
Practical placement
Does not concern
Bibliography
1. Z. Bojarski, M. Gigla, K. Stróż, M. Surowiec, Krystalografia. Podręcznik wspomagany komputerowo, PWN, Warszawa, 1996, 2001, 2007.
2. Z. Trzaska Durski, H. Trzaska Durska, Podstawy krystalografii, Oficyna Wydawnicza Politechniki Warszawskiej, Warszawa 2003.
3. M. van Meerssche i J. Feneau-Dupont, Krystalografia i chemia strukturalna, PWN, Warszawa 1984.
4. C. Giacovazzo, H. Z. Monaco, D. Biterbo, F. Scordari, G. Gilli, G. Zanotti, M. Catti, Fundamentals of Crystallography, IUCR, Oxford University Press, 2000.
Additional information
Additional information (registration calendar, class conductors, localization and schedules of classes), might be available in the USOSweb system: