Physicochemical characterization of the materials 1200-1ZMCHFPW5
The lecture is combined with the experimental class. During lecture the following techniques will be described: inductively coupled plasma – mass spectrometry (SP, LA); X-ray photoelectron spectroscopy (XPS); secondary ion mass spectrometry (SIMS), surface enhanced resonance Raman spectroscopy (SERS and SERRS), photoelectrochemical methods for determination of the activity and morphology of photocells, characterization of the phase boundary water/air with use of Langmuir-Blodgett method, Brewster angle microscopy, elipsometry, microquartz balance, wetting angle analysis, infrared spectroscopy for monolayers analysis (PMIRRAS), X-ray diffraction, Scanning Electron Microscopy, Transmission Electron Microscopy, Atomic Force Maicroscopy, Dynamic Light Scattering, Zeta potential analysis. The methods of decomposition and extraction before ICP MS analysis.
Term 2023Z:
None |
Term 2024Z:
None |
Type of course
Prerequisites (description)
Course coordinators
Mode
Learning outcomes
Students should:
1. Explain the fundamentals of each technique presented within this lecture
2. Describe current techniques used in the physic-chemical analysis of materials
3. Be able to explain how to prepare the sample for analysis by each technique described within this lecture
4. Know how the equipment described within this lecture operates
5. Be able to choose appropriate technique to determine specific physic-chemical properties of materials
Assessment criteria
Written exam
Bibliography
1. Kęcki Z., Podstawy spektroskopii molekularnej, Wydawnictwo Naukowe PWN, Warszawa 1992
2. Barańska M., w Fotochemia i spektroskopia optyczna. Ćwiczenia laboratoryjne (red. Najbar J., Turek A.), Wydawnictwo Naukowe PWN, Warszawa 2009.
3. Feldman L. C., Mayer J. W., Fundamentals of Surface and Thin Film Analysis, North- -Holland, New York–Amsterdam–London 1986
4. Spectroscopy for Surface Science (red. Clark R. J. H., Hester R. E.), John Wiley & Sons, Chichester 1998
5. Bhushan B., Fusch H., Hosaka S., Applied scanning probe methods, Springer, 2002.
6. Metody spektroskopowe i ich zastosowanie do identyfikacji związków organicznych (red. Zieliński W., Rajca A.), WNT, Warszawa 2000
7. de Hoffmann E., Charette J., Stoobant V., Spektrometria mas, WNT, Warszawa 1998
8. Adamson A.W., Chemia fizyczna powierzchni, PWN, Warszawa 1963
9. Pigoń K., Ruziewicz Z., Chemia fizyczna. 1. Podstawy fenomenologiczne, Wyd. Naukowe PWN, Warszawa 2005
Term 2023Z:
None |
Term 2024Z:
None |
Additional information
Additional information (registration calendar, class conductors, localization and schedules of classes), might be available in the USOSweb system: