Crystallography A 1200-2EN-CRALE1M
The course covers the following issues: Symmetry and its properties, crystallization techniques, crystal growth theories, imperfect crystals, energetic aspects of the crystals structures, classification of solids (ionic, covalent, metallic, molecular) their characteristics. Properties of X-rays. Laue and Bragg’s diffraction theories; reciprocal space. Symmetry of diffraction pattern, Intensity of reflections as a source of information about arrangement of atoms and/or ions in the crystal unit cell. Phase problem. Experimental methods of X-ray crystallography: Laue method, oscillation method, goniometric methods; determination of unit cell parameters; Powder diffraction. Elements of crystallophysics. Interpretation of the crystal and molecular structure based on crystallographic databases
Estimated Student Workload (per semester): 25 hours
• Attendance at lectures – 10 hours
• Consultations – 5 hours
• Preparation for the final examination – 10 hours
Type of course
Course coordinators
Learning outcomes
The aim of the course is to present the information that will allow students to use and understand scientific literature on the structures of small molecules determined by X-ray diffraction.
After completing the course, the student:
• knows and understands the fundamentals of crystallography in the field of symmetry description and crystal lattice structures, as well as X-ray diffraction studies of crystals and the X-ray determination of the geometric structure of molecules;
• knows the basic aspects of the construction and operation of modern measurement equipment supporting scientific research in a given chemical specialization;
• has a good understanding of current trends in the development of chemistry and the latest scientific discoveries in a given chemical specialization;
• is able to apply X-ray methods to the analysis of crystal and molecular structures in the crystalline phase;
• possesses advanced knowledge and skills enabling the use of professional literature, databases, and other sources of information, as well as the ability to assess the reliability of the information obtained;
• is able to independently acquire knowledge and develop professional skills using various written and electronic sources, including foreign-language materials;
• has a command of English sufficient to use basic professional literature in chemistry and related sciences (at the B2+ level);
• understands the need for continuous education and is able to independently search for information in the literature, including foreign-language sources;
• is able to think and act in a creative and entrepreneurial manner.
Assessment criteria
Exam requirements:
- crystallization techniques, crystal growth theories,
- energetic aspects of the crystals structures, classification of solids (ionic, covalent, metallic, molecular)
- Properties of X-rays.
- Laue and Bragg’s diffraction theories;
- reciprocal space.
- Symmetry of diffraction pattern, Intensity of reflections as a source of information about arrangement of atoms and/or ions in the crystal unit cell.
- phase problem and ways to solve it.
- experimental methods of X-ray crystallography: Laue method, oscillation method, goniometric methods; determination of unit cell parameters;
- powder diffraction.
- Elements of crystallophysics.
- Interpretation of the crystal and molecular structure based on crystallographic databases
Practical placement
none
Bibliography
1. Z. Trzaska Durski, H. Trzaska Durska, Podstawy krystalografii strukturalnej i rentgenowskiej, Wydawnictwo Naukowe PWN, Warszawa, 1994 (in Polish).
2. Z. Bojarski, M. Gigla, K. Stróż, M. Surowiec, Krystalografia. Podręcznik wspomagany komputerowo, Wydawnictwo Naukowe PWN, Warszawa, 1996, 2001, 2007 (in Polish).
3. Z. Trzaska Durski, H. Trzaska Durska, Podstawy krystalografii, Oficyna Wydawnicza Politechniki Warszawskiej, Warszawa 2003 (in Polish).
4. P. Luger, Rentgenografia strukturalna monokryształów, PWN, Warszawa 1989 (in Polish).
5. M. van Meerssche i J. Feneau-Dupont, Krystalografia i chemia strukturalna, PWN, Warszawa 1984 (in Polish).
6. P. Luger, Modern X-ray Analysis on Single Crystals, Walter de Gruyter and Co., Berlin 1980 (in English).
7. C. Giacovazzo, H. Z. Monaco, D. Biterbo, F. Scordari, G. Gilli, G. Zanotti, M. Catti, Fundamentals of Crystallography, IUCR, Oxford University Press, 2000 (in English)
Additional information
Additional information (registration calendar, class conductors, localization and schedules of classes), might be available in the USOSweb system: